Technology & Telecommunication Services » Semiconductors | Nova Measuring Instruments Ltd.

Nova Measuring Instruments Ltd. | Income Statement

Fiscal year is January-December. All values USD Thousands.
2013
2014
2015
2016
2017
2018
Sales/Revenue
111,509.00
120,618.00
148,514.00
163,903.00
221,992.00
251,134
Cost of Goods Sold (COGS) incl. D&A
52,438.00
57,005.00
72,752.00
90,381.00
92,563.00
107,659
Gross Income
59,071.00
63,613.00
75,762.00
73,522.00
129,429.00
143,475
SG&A Expense
47,919.00
46,576.00
60,276.00
63,356.00
71,610.00
83,033
EBIT
11,152.00
17,037.00
15,486.00
10,166.00
57,819.00
60,442
Unusual Expense
1,181.00
-
2,700.00
-
-
-
Non Operating Income/Expense
693.00
437.00
562.00
1,216.00
2,276.00
-
Pretax Income
13,026.00
17,474.00
12,224.00
11,382.00
60,095.00
63,426
Income Tax
2,511.00
1,178.00
3,501.00
1,738.00
13,636.00
9,051
Consolidated Net Income
10,515.00
18,652.00
15,725.00
9,644.00
46,459.00
54,375
Net Income
10,515.00
18,652.00
15,725.00
9,644.00
46,459.00
54,375
Net Income After Extraordinaries
10,515.00
18,652.00
15,725.00
9,644.00
46,459.00
54,375
Net Income Available to Common
10,515.00
18,652.00
15,725.00
9,644.00
46,459.00
54,375
EPS (Basic)
0.39
0.68
0.58
0.35
1.68
1.94
Basic Shares Outstanding
27,091.00
27,447.00
27,185.00
27,175.00
27,696.00
28,022.50
EPS (Diluted)
0.38
0.67
0.57
0.35
1.63
1.89
Diluted Shares Outstanding
27,373.00
27,807.00
27,510.00
27,503.00
28,524.00
28,765.30
EBITDA
14,674.00
20,988.00
25,106.00
16,760.00
63,998.00
68,126

About Nova Measuring Instruments

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Address
Weizmann Science Park
Ness-Ziona TA 74140
Israel
Employees -
Website http://www.novameasuring.com
Updated 07/08/2019
Nova Measuring Instruments Ltd. providing metrology solutions for the semiconductor manufacturing industry. It offers in-line Optical and x-ray stand-alone metrology systems, as well as integrated optical metrology systems, which are attached directly to wafer fabrication process equipment. Its products include set of in-situ, integrated and stand-alone metrology platforms suited for dimensional, films and material metrology measurements for process control across multiple semiconductor manufacturing process steps including lithography, Etch, CMP and deposition.

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